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NV-F 2D/3D Hybrid Automation System - NV-F3200

NanoSystem, which aims to be the world’s best company ...

Introduction

The most advanced non-contact 3D surface profiler

Model / Item NV-F2700 NV-F3200
Measuring Principle Non-contact, Three-dimensional
White-Light Scanning Interferometry(WSI)
Phase Shift Interferometry(PSI)
Scan Module PZT Scanner
Coaxial Illumination White light LED Illumination(Light Source)
Objective Lens 2.5x, 5x, 10x 2.5x, 5x, 10x, 20x, 50x, 100x