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Electronic Microscope
- Lithium battery and Solar PV
Advanced Packaging
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iAS Large FOV Scanner
iAS series products are full FOV scanner independently developed by iSTAR, for high-end display applications, IC substrate, and advanced packaging, and applications such as large FOV exposure of MicroLED, IC substrate and Fan-out.
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iAB Automatic Wafer bonder
iAB series automatic wafer bonder is independently developed by iSTAR for automatic wafer to wafer bonding applications.
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iCB Automatic Chip bonder
iCB series products are automatic chip bonding equipment independently developed by iSTAR, which features automic high precision chip to chip, chip to wafer bonding, and is suitable for application as infrared sensor, Micro LED and chiplet etc.
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SAICAS Interfacial Analysis System
SAICAS is used to measure the adhesion of paints and coatings by comparing peel strength, as well as to assess the shear strength of materials. The instrument also performs diagonal cutting as a pretreatment for surface analysis. Standard sample sizes range from flat plates approximately 20 x 20 mm to 50 x 50 mm, with a maximum thickness of 10 mm. As the need to evaluate the peelability, adhesion, and strength of thin films—such as submicron and multilayer films—grows, reliable methods are scarce. These evaluations are challenging due to the impact of the material’s strength and structure. However, the surface and interface property analyzer addresses this issue by measuring the adhesion and shear strength of thin films through a cutting method.
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WSI-300
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NV-F 2D/3D Hybrid Automation System - NV-F2700
The most advanced non-contact 3D surface profiler
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NV-F 2D/3D Hybrid Automation System - NV-F3200
The most advanced non-contact 3D surface profiler
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