systems perform capacitance-voltage ( CV
) and current-voltage ( IV ) measurements directly on the unmetalized wafer using a uniquely designed Mercury
probe. We offer the widest range of Mercury probe geomertries
and special capacitance measurement electronics. This permits our systems
to probe and characterize a wide range of materials, including
semi-conductors, oxides, dielectrics, SOI ( silicon
on insulator ), and films on conducting or insulating substrates.